Maud A useful tool for analyzing materials and textures
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analyzer diffraction reflectivity diffraction analysis

Maud Description

MAUD stands for Material Analysis Using Diffraction. It is a general diffraction/reflectivity analysis program mainly based on the Rietveld method, but not limited to. Thanks to the fact that it is completely written in the Java programming language, you should be able to effortlessly run Maud on a variety of systems. Main features: Easy to use, every action is controlled by a GUI Works with X-ray, synchrotron, Neutron, TOF Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported Ab-initio structure solution integration, from peak finding, indexing to solving Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics) Le Bail fitting Quantitative phase analysis Microstructure analysis (size-strain, anisotropy and distributions included) Texture and residual stress analysis using part or full spectra MEEM and superflip algorithm for Electron Density Maps and fitting Thin film and multilayer aware; film thickness and absorption models Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation Works with TEM diffraction images and electron scattering Several data files input formats Works and input images from 2D detectors (image plates, CCD) CIF compliance for input/output; import structures from databases

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